NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-00-827-8039 Item Description: MICROCIRCUIT,DIGITAL | 5962 | 008278039 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | U | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
17-12054-1 | 3 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 0.660 INCHES MINIMUM AND 0.785 INCHES UM" |
ADAT | BODY WIDTH | 0.220 INCHES MINIMUM AND 0.280 INCHES UM" |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.180 INCHES UM" |
AEHX | UM POWER DISSIPATION RATING | 26.0 MILLIWATTS" |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS" |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS" |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND EXPANDABLE AND MEDIUM SPEED" |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS" |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
CQWX | OUTPUT LOGIC FORM | DIODE-TRANSISTOR LOGIC" |
CQZP | INPUT CIRCUIT PATTERN | DUAL 5 INPUT" |
CSSL | DESIGN FUNCTION AND QUANTITY | 2 GATE, NAND" |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL" |
CZEQ | TIME RATING PER CHACTERISTIC | 80.00 NANOSECONDS UM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 30.00 NANOSECONDS UM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
TEST | TEST DATA DOCUMENT | 80070-17-12054 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA" |
ADAQ | BODY LENGTH | 0.660 INCHES MINIMUM AND 0.785 INCHES UM" |
ADAT | BODY WIDTH | 0.220 INCHES MINIMUM AND 0.280 INCHES UM" |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.180 INCHES UM" |
AEHX | UM POWER DISSIPATION RATING | 26.0 MILLIWATTS" |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS" |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS" |
CBBL | FEATURES PROVIDED | MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND EXPANDABLE AND MEDIUM SPEED" |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS" |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE" |
CQWX | OUTPUT LOGIC FORM | DIODE-TRANSISTOR LOGIC" |
CQZP | INPUT CIRCUIT PATTERN | DUAL 5 INPUT" |
CSSL | DESIGN FUNCTION AND QUANTITY | 2 GATE, NAND" |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL" |
CZEQ | TIME RATING PER CHACTERISTIC | 80.00 NANOSECONDS UM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 30.00 NANOSECONDS UM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT" |
TEST | TEST DATA DOCUMENT | 80070-17-12054 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRA" |